Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700
Brand: Hitachi High-Tech | Category: Scientific & Laboratory Equipment
The SU8700 is a Schottky field emission scanning electron microscope offering high probe current for fast microanalysis alongside ultrahigh resolution imaging. Low landing voltage operation without stage bias suits beam sensitive specimens.
Technical Specifications
| Parameter | Value |
|---|---|
| Secondary electron resolution | 0.6 nm at 15 kV, 0.8 nm at 1 kV, 0.9 nm at 0.3 kV |
| Magnification | 20x to 2,000,000x |
| Electron gun | Schottky emitter |
| Accelerating voltage | 0.1 kV to 30 kV |
| Landing voltage | 0.01 kV to 7 kV |
| Probe current | maximum 200 nA |
Get a Quote
Request an itemised quotation covering the proposed configuration, availability, lead time and agreed supply and support scope.
Useful details to share
- Intended application, process or teaching activity
- Required capability and equipment it must work with
Share what you know. You can start with your name and a phone number or email; final specifications can follow.
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Hitachi High-Tech equipment requirements in Bangladesh.
Phone: +8801805987890 | Email: info@vvon.com.bd
Back to Scientific & Laboratory Equipment
More from Electron Microscopy
- Ultrahigh-Resolution Scanning Electron Microscope SU9600
The SU9600 is the flagship Hitachi cold field emission scanning electron microscope, built for subnanometre observation. An in lens objective and ExB detection give good signal to noise at low probe current, for semiconductor devices and advanced materials.
- Ultrahigh-Resolution Scanning Electron Microscope SU8600
The SU8600 is a cold field emission scanning electron microscope for ultrahigh resolution imaging. An upper detector with ExB filter mixes secondary and backscattered signals, and optional detectors add cathodoluminescence and STEM capability.
- Field Emission Transmission Electron Microscope HF5000
The HF5000 is a 200 kV aberration corrected TEM and STEM with a cold field emission source. A single objective lens configuration combines high specimen tilt with large solid angle EDX detection, for imaging and analysis at the atomic scale.